doc. no : qw0905-la12b/2h5g1h rev. : date : - 2005 11 - jan a data sheet ligitek electronics co.,ltd. property of ligitek only led array la12b/2h5g1h
1.0min 2.3typ note : 1.all dimension are in millimeter tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. lh5620 lg5620 package dimensions la12b/2h5g1h part no. page 1/5 ?? 0.5 typ ligitek electronics co.,ltd. property of ligitek only - + h hggg h g g 56.7 ? 0.5 6.1 1.3 7.0x7=49.0 6.0 8.5 5.2 3.75 1.5max 12.5min 1.0min 2.3typ ?? 0.5 typ 6.2 8.0 6.0 3.0 1.4 13.5min 2.6
-40 ~ +100 tstg storage temperature note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. gap la12b/2h5g1h gap 1.8 0.8 90 1.7 2.6 0.5 red diffused red 697 565 green diffused green 1.7 30 2.6 0.8 142 142 typical electrical & optical characteristics (ta=25 j ) material soldering temperature part no typ. luminous intensity @10ma(mcd) peak wave length f pnm spectral halfwidth ??f nm forward voltage @ ma(v) emitted lens color min. min. max. 20 viewing angle 2 c 1/2 (deg) tsol max 260 j for 5 sec max (2mm from body) j page 2/5 part no. reverse current @5v operating temperature peak forward current duty 1/10@10khz absolute maximum ratings at ta=25 j forward current power dissipation parameter 15 30 ma i f t opr ir -40 ~ +85 10 120 100 pd i fp 40 60 j g a ma mw g symbol h ratings unit ligitek electronics co.,ltd. property of ligitek only la12b/2h5g1h
relative intensity@20ma 600 0.0 0.5 wavelength (nm) 700 800 900 ambient temperature( j ) fig.5 relative intensity vs. wavelength fig.3 forward voltage vs. temperature forward voltage@20ma normalize @25 j 1.0 -20 -40 0.8 1.0 0.9 1.1 1.2 0.5 relative intensity@20ma normalize @25 j -20 ambient temperature( j ) 80 60 40 20 0-40 100 0.0 80 60 02040 100 fig.4 relative intensity vs. temperature 2.5 1.5 1.0 2.0 3.0 fig.1 forward current vs. forward voltage typical electro-optical characteristics curve 100 forward current(ma) 0.1 1.0 1.0 10 1000 h chip relative intensity normalize @20ma forward voltage(v) 2.0 3.0 4.0 5.0 1.0 0.0 1.5 1.0 0.5 2.0 2.5 forward current(ma) 10 100 1000 fig.2 relative intensity vs. forward current 3.0 ligitek electronics co.,ltd. property of ligitek only 1000 3/5 part no. page la12b/2h5g1h
4/5 fig.6 directive radiation part no. g chip 3.5 3.0 2.5 1.5 1.0 0.5 0.0 2.0 60 100 80 02040 -40 -20 0.9 0.8 100 80 5.0 4.0 3.0 2.0 1.0 0.5 0.0 650 600 550 500 1.2 1.1 1.0 60 40 20 0 -20 -40 3.0 2.5 2.0 1.5 1.0 0.5 0.0 1000 100 10 1.0 1000 100 10 1.0 0.1 1.0 ligitek electronics co.,ltd. property of ligitek only relative intensity normalize @20ma fig.2 relative intensity vs. forward current forward current(ma) page forward current(ma) fig.1 forward current vs. forward voltage forward voltage(v) typical electro-optical characteristics curve relative intensity@20ma normalize @25 j ambient temperature( j ) fig.4 relative intensity vs. temperature forward voltage@20ma normalize @25 j wavelength (nm) relative intensity@20ma ambient temperature( j ) fig.5 relative intensity vs. wavelength fig.3 forward voltage vs. temperature la12b/2h5g1h
the purpose of this test is the resistance of the device under tropical for hous. the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. this test intended to see soldering well performed or not. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. solderability test 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec high temperature high humidity test thermal shock test solder resistance test 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. 1.ta=65 j? 5 j 2.rh=90 %~95% 3.t=240hrs ? 2hrs mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202:103b jis c 7021: b-11 5/5 page part no. the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. the purpose of this is the resistance of the device which is laid under ondition of hogh temperature for hours. this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. operating life test 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, + 72hrs) high temperature storage test low temperature storage test 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) reliability test: test item test condition description mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 reference standard ligitek electronics co.,ltd. property of ligitek only la12b/2h5g1h
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